User Profiles Site map description
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Alex HalesAlex Hales
Alex jiménezAlex jiménez- Alex MamAlex Mam
- Alex Novo (Innovation and development Agency - Kazakhstan)Alex Novo (Innovation and development Agency - Kazakhstan)
- Alex RomaAlex Roma
- Alexa VinceAlexa Vince
Alexander KornichAlexander Kornich- Alexander AdrowitzerAlexander Adrowitzer
Alexander KvashninAlexander Kvashnin
Alexander Peña GascoAlexander Peña Gasco- Alexander StroganovAlexander Stroganov
Alexander UspenskiyAlexander Uspenskiy- Alexandr MitrofanovAlexandr Mitrofanov
- Alexandra LepadatuAlexandra Lepadatu
- Alexandre PriedolsAlexandre Priedols
- Alexandre TuroziAlexandre Turozi
- Alexandrine DuantAlexandrine Duant
- Alexandro StrackAlexandro Strack
- Alexandros StavrinadisAlexandros StavrinadisAlexandros Stavrinadis
ICFO NEST Fellow at ICFO from Spain · Barcelona Area
I enjoy developing and understanding new materials that can improve existing technologies and create new ones. My current research is focused on semiconductor nanomaterials and thin films for optoelectronic applications like solar cells. I work on the synthesis and characterization of inorganic semiconductor and metallic thin films and nanoparticles. I use nanomaterials to make solar cells (photovoltaics) and other type of devices like thin film transistors (FETs) and photodetectors. Ultimately, I measure the efficiency and various optical and electronic properties of those devices and use the results as feedback to to innovate on and improve the conditions used during material growth and processing. Some material and thin film fabrication techniques I apply in my research are: -Physical Vapor Deposition (PVD) e.g. sputtering, thermal evaporation) -Thermal annealing processes i.e. rapid thermal annealing (RTP) -Colloidal synthesis of nanoparticles and quantum dots i.e. hot injection method -Sol-Gel i.e. for fabrication of oxide thin films In my work I use a number of material characterization techniques like -TEM, HREM, SAED, XRD, XPS, UPS, FT-IR, Raman, TGA, SEM, FIB, EDX, UV-Vis, PL, Cyclic Voltammetry Some of the most common optoelectronic measurements and analysis methods I utilize for understanding the physics of my semiconductor materials and devices are: -J-V characteristics under solar light -External quantum efficiency (EQE) measurements at short circuit and applied bias conditions -C-V characteristics and Mott-Schottky analysis -Transient photo- voltage and current (TPV, TPC) measurements -Stress and aging test of solar cells under various environmental conditions Some types of materials I am very familiar with are: -Quantum dots (e.g. PbS, CdS, PbSe) -Semiconductor Nanoparticles (e.g. Bi2S3, SnS) -Wide bandgap semiconductor films (e.g. ZnO, Ti2O) -Semiconductor polymers (e.g. P3HT, MEH-PPV). 
Alexei MikhailovAlexei Mikhailov- Alexey SpichakAlexey SpichakAlexey Spichak 2002 – Present NIPIneftegas JSC. Chief Design Engineer, Chief HSE Engineer. Uralsk, Kazakhstan. 1994 – 2002 “Zenit Plant” JSC, Head of design office, designer of higher category, Uralsk, Kazakhstan 1991 – 1994 “Dar” small enterprise, Lead designer, Uralsk, Kazakhstan 1990 – 1991 MF “NESO” Engineering department, Engineer of 1 category, Uralsk, Kazakhstan 1988 – 1990 Uralsk integrated department of the Institute “Karagandaindustroyproekt”. Engineer of 1 category, Uralsk, Kazakhstan 1977 – 1988 “Uralskpromstroy” Trust. Mechanic
Alexey TatarinovAlexey Tatarinov- Alexey YurovAlexey Yurov
- Alexis ArceAlexis Arce
- Alexis BenavidesAlexis Benavides
- Alexis Goulet-HanssensAlexis Goulet-Hanssens
- Alfie SpencerAlfie Spencer
- Alfons Nonell-CanalsAlfons Nonell-Canals
Alfonso del Rey PérezAlfonso del Rey Pérez
